ISIS Publications

Export 10 results:
Sort by: [ Author  (Asc)] Title Type Year
Filters: Author is Goebel Kai  [Clear All Filters]
A B C D E F G H I J K L M N O P Q R S T U V W X Y Z 
C
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai, "Prognostics Approach for Power MOSFET under Thermal-Stress Aging", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
J
Jose, C., C. Kulkarni, G. Biswas, S. Sankalita, and G. Kai, "A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging", Annual Conference of the Prognostics and Health Management Society (PHM 2011), Montreal, Canada, Prognostics and Health Management Society, 10/2011.
Jose, C., C. Kulkarni, G. Biswas, and G. Kai, "Towards Prognostics of Electrolytic Capacitors", Infotech@Aerospace 2011, St. Louis, Missouri, AIAA, 04/2011.
K
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostic Modeling and Experimental Techniques for Electrolytic Capacitor Health Monitoring", 8th International Workshop on Structural Health Monitoring, IWSHM 2011, Stanford, CA, 09/2011.
Kulkarni, C., C. Jose, G. Biswas, and G. Kai, "Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions", Annual Conference of the Prognostics and Health Management Society, Minneapolis, MN, PHM Society, 09/2012. Abstract
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostics Techniques For Capacitor Degradation and Health Monitoring", The Maintenance & Reliability Conference, MARCON 2011, Knoxville, TN, MARCON, 03/2011. Abstract  Download: MARCON_2011_Kulkarni_Biswas_Celaya_Goebel.pdf (367.09 KB)