ISIS Publications

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C
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai, "Prognostics Approach for Power MOSFET under Thermal-Stress Aging", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
J
Jose, C., C. Kulkarni, G. Biswas, S. Sankalita, and G. Kai, "A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging", Annual Conference of the Prognostics and Health Management Society (PHM 2011), Montreal, Canada, Prognostics and Health Management Society, 10/2011.