|Title||Experimental studies of ageing in electrolytic capacitors|
|Publication Type||Conference Proceedings|
|Year of Conference||2010|
|Authors||Kulkarni, C., G. Biswas, X. Koutsoukos, K. Goebel, and J. Celaya|
|Conference Name||Annual Conference of the Prognostics and Health Management Society 2010|
|Publisher||Prognostics and Health Management Society|
|Conference Location||Porltand, OR|
Understanding the aging mechanisms of electronic components in an avionics system is extremely important as they are part of the critical sub-systems avionics which includes the GPS and INAV systems. Electrolytic capacitors and MOSFET’s have higher failure rates than the other components in DC-DC power converter systems. With increased use of electronics in avionics system, it becomes very much important to understand these components degradation mechanisms and their effects on the rest of the system. Our current work focuses on analyzing and modeling degradation phenomena in electrolytic capacitors and its effects on the output of DC-DC converter systems. The output degradation is typically measured by the increase in ripple current and the drop in output voltage at the load. Typically the ripple current effects dominate, and they can have adverse effects on downstream components. For example, in avionics systems where the power supply drives a GPS unit, ripple currents can cause glitches in the GPS position and velocity output, and this may cause errors in the Inertial Navigation (INAV) system causing the aircraft to fly off course.