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Kai Goebel
First name
Kai
Last name
Goebel
Kulkarni, C., Biswas, G., Koutsoukos, X., Celaya, J., & Goebel, K
.
(2010)
.
Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters
.
In
ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems
.
Philadelphia, PA:
ASME
. (
Original work published
10/2010AD)
View
Kulkarni, C., Biswas, G., Koutsoukos, X., Goebel, K., & Celaya, J
.
(2010)
.
Experimental studies of ageing in electrolytic capacitors
.
Annual Conference of the Prognostics and Health Management Society 2010
.
Porltand, OR:
Prognostics and Health Management Society
. (
Original work published
10/2010AD)
View
Kulkarni, C., Biswas, G., Koutsoukos, X., Jose, C., & Goebel, K
.
(2010)
.
Integrated Diagnostic/Prognostic Experimental Setup for Capacitor Degradation and Health Monitoring
.
IEEE AUTOTESTCON 2010
.
Orlando, FL:
IEEE
. (
Original work published
09/2010AD)
View
Kulkarni, C., Jose, C., Biswas, G., & Goebel, K
.
(2012)
.
Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress
.
1st European Conference of the Prognostics and Health Management Society
.
Dresden, Germany
. (
Original work published
07/2012AD)
View
Kulkarni, C., Jose, C., Biswas, G., & Goebel, K
.
(2012)
.
Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors
.
AIAA Infotech@Aerospace Conference
.
Garden Grove, CA:
American Institute of Aeronautics and Astronautics,
. (
Original work published
06/2012AD)
View
Celaya, J., Kulkarni, C., Biswas, G., & Goebel, K
.
(2012)
.
Accelerated Aging in Electrolytic Capacitors for Prognostics
.
IEEE - The Annual Reliability and Maintainability Symposium
.
Reno, Nevada:
IEEE
. (
Original work published
01/2012AD)
View
Kulkarni, C., Celaya, J., Biswas, G., & Goebel, K
.
(2012)
.
Prognostics of Power Electronics, methods and validation experiments
.
2012 Ieee Autotestcon Proceedings
.
View
Kulkarni, C., Celaya, J., Goebel, K., & Biswas, G
.
(2012)
.
Prognostics of Power Electronics, methods and validation experiments
.
IEEE AUTOTESTCON
.
Anaheim, CA:
IEEE
. (
Original work published
09/2012AD)
View