Kulkarni, C. ., Biswas, G. ., Koutsoukos, X. ., Celaya, J. ., & Goebel, K. . (2010). Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters. In ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems. Philadelphia, PA: ASME. (Original work published October 2010)

Kulkarni, C. ., Biswas, G. ., Koutsoukos, X. ., Goebel, K. ., & Celaya, J. . (2010). Experimental studies of ageing in electrolytic capacitors. Annual Conference of the Prognostics and Health Management Society 2010. Porltand, OR: Prognostics and Health Management Society. (Original work published October 2010)

Kulkarni, C. ., Biswas, G. ., Koutsoukos, X. ., Jose, C. ., & Goebel, K. . (2010). Integrated Diagnostic/Prognostic Experimental Setup for Capacitor Degradation and Health Monitoring. IEEE AUTOTESTCON 2010. Orlando, FL: IEEE. (Original work published September 2010)

Kulkarni, C. ., Jose, C. ., Biswas, G. ., & Goebel, K. . (2012). Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress. 1st European Conference of the Prognostics and Health Management Society. Dresden, Germany. (Original work published July 2012)

Kulkarni, C. ., Jose, C. ., Biswas, G. ., & Goebel, K. . (2012). Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors. AIAA Infotech@Aerospace Conference. Garden Grove, CA: American Institute of Aeronautics and Astronautics. (Original work published June 2012)

Celaya, J. ., Kulkarni, C. ., Biswas, G. ., & Goebel, K. . (2012). Accelerated Aging in Electrolytic Capacitors for Prognostics. IEEE - The Annual Reliability and Maintainability Symposium. Reno, Nevada: IEEE. (Original work published January 2012)

Kulkarni, C. ., Celaya, J. ., Biswas, G. ., & Goebel, K. . (2012). Prognostics of Power Electronics, methods and validation experiments. 2012 IEEE AUTOTESTCON Proceedings.

Kulkarni, C. ., Celaya, J. ., Goebel, K. ., & Biswas, G. . (2012). Prognostics of Power Electronics, methods and validation experiments. IEEE AUTOTESTCON. Anaheim, CA: IEEE. (Original work published September 2012)