@proceedings{263,
  author = {Jose Celaya and Saxena Abhinav and Chetan Kulkarni and Saha Sankalita and Goebel Kai},
  title = {Prognostics Approach for Power MOSFET under Thermal-Stress Aging},
  year = {2012},
  journal = {IEEE - The Annual Reliability and Maintainability Symposium},
  month = {01/2012},
  publisher = {IEEE},
  address = {Reno, Nevada},
}