Kulkarni, C., G. Biswas, X. Koutsoukos, G. Kai, and C. Jose,
"Physics of Failure Models for Capacitor Degradation in DC-DC Converters",
The Maintenance & Reliability Conference, MARCON 2010, Knoxville, TN, MARCON, 02/2010.
Abstract
Download: KulkarniBiswasKoutsoukos_GoebelCelaya_MARCON2010.pdf (337.41 KB)
Kulkarni, C., C. Jose, G. Biswas, and G. Kai,
"Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics",
IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012.
Kulkarni, C., C. Jose, G. Biswas, and K. Goebel,
"Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors",
AIAA Infotech@Aerospace Conference, Garden Grove, CA, American Institute of Aeronautics and Astronautics,, 06/2012.
Download: AIAA2012_Final_Kulkarni_Celaya_Biswas_Goebel1.pdf (385.28 KB)
Kulkarni, C., G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel,
"Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters",
ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Philadelphia, PA, ASME, 10/2010.
Kulkarni, C., G. Biswas, B. Raj, and K. Kyusung,
"Effects of Degradation in DC-DC Converters on Avionics Systems: A Model Based Approach",
Machinery Failure Prevention Technology Conference, MFPT 2010, Huntsville, AL, MFPT, pp. 8-13, 04/2010.
Abstract
Download: KulkarniBiswas_BharadwajKim_MFPT2010.pdf (240.4 KB)
Kulkarni, C., G. Biswas, X. Koutsoukos, K. Goebel, and J. Celaya,
"Experimental studies of ageing in electrolytic capacitors",
Annual Conference of the Prognostics and Health Management Society 2010, Porltand, OR, Prognostics and Health Management Society, 10/2010.
Abstract
Kulkarni, C., C. Jose, G. Biswas, and G. Kai,
"Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions",
Annual Conference of the Prognostics and Health Management Society, Minneapolis, MN, PHM Society, 09/2012.
Abstract
Kulkarni, C., G. Biswas, C. Jose, and G. Kai,
"Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors",
IEEE 2011 Workshop on Accelerated Stress Testing & Reliability, San Francisco, CA, IEEE, 10/2011.
Kulkarni, C., G. Biswas, C. Jose, and G. Kai,
"Prognostics Techniques For Capacitor Degradation and Health Monitoring",
The Maintenance & Reliability Conference, MARCON 2011, Knoxville, TN, MARCON, 03/2011.
Abstract
Download: MARCON_2011_Kulkarni_Biswas_Celaya_Goebel.pdf (367.09 KB)
Kulkarni, C., J. Celaya, K. Goebel, and G. Biswas,
"Prognostics of Power Electronics, methods and validation experiments",
IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012.
Abstract