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Conference Paper
Kulkarni, C., G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel, "Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters", ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Philadelphia, PA, ASME, 10/2010.
Sun, F., A. Dubey, C. Kulkarni, and A. Guarneros, "Distributed and Stacked Neural Network for Anomaly Detection in Small Satellites", 15th Annual Cubesat Developer Workshop, San Luis Obispo, 2018. Abstract
Kulkarni, C., G. Biswas, B. Raj, and K. Kyusung, "Effects of Degradation in DC-DC Converters on Avionics Systems: A Model Based Approach", Machinery Failure Prevention Technology Conference, MFPT 2010, Huntsville, AL, MFPT, pp. 8-13, 04/2010. Abstract  Download: KulkarniBiswas_BharadwajKim_MFPT2010.pdf (240.4 KB)
Raj, B., C. Kulkarni, K. Kyusung, and G. Biswas, "Model-Based Avionics Systems Fault Simulation and Detection", American Institute of Aeronautics and Astronautics, AIAA Infotech Aerospace 2010, Atlanta, GA, 04/2010.
Kulkarni, C., G. Biswas, X. Koutsoukos, G. Kai, and C. Jose, "Physics of Failure Models for Capacitor Degradation in DC-DC Converters", The Maintenance & Reliability Conference, MARCON 2010, Knoxville, TN, MARCON, 02/2010. Abstract  Download: KulkarniBiswasKoutsoukos_GoebelCelaya_MARCON2010.pdf (337.41 KB)
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors", IEEE 2011 Workshop on Accelerated Stress Testing & Reliability, San Francisco, CA, IEEE, 10/2011.
Conference Proceedings
Kulkarni, C., C. Jose, G. Biswas, and G. Kai, "Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics", IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012.
Celaya, J., C. Kulkarni, G. Biswas, and K. Goebel, "Accelerated Aging in Electrolytic Capacitors for Prognostics", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
Kulkarni, C., C. Jose, G. Biswas, and G. Kai, "Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions", Annual Conference of the Prognostics and Health Management Society, Minneapolis, MN, PHM Society, 09/2012. Abstract
Sun, F., A. Dubey, C. Kulkarni, N. Mahadevan, and A. G. Luna, "A Data Driven Health Monitoring Approach to Extending Small Sats Mission", ANNUAL CONFERENCE OF THE PROGNOSTICS AND HEALTH MANAGEMENT SOCIETY 2018, 09/2018. Abstract  Download: data-driven-health.pdf (2.29 MB)
Kulkarni, C., G. Biswas, X. Koutsoukos, K. Goebel, and J. Celaya, "Experimental studies of ageing in electrolytic capacitors", Annual Conference of the Prognostics and Health Management Society 2010, Porltand, OR, Prognostics and Health Management Society, 10/2010. Abstract
Kulkarni, C., G. Biswas, X. Koutsoukos, C. Jose, and K. Goebel, "Integrated Diagnostic/Prognostic Experimental Setup for Capacitor Degradation and Health Monitoring", IEEE AUTOTESTCON 2010, Orlando, FL, IEEE, 09/2010.
Jose, C., C. Kulkarni, G. Biswas, S. Sankalita, and G. Kai, "A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging", Annual Conference of the Prognostics and Health Management Society (PHM 2011), Montreal, Canada, Prognostics and Health Management Society, 10/2011.
Kulkarni, C., C. Jose, G. Biswas, and K. Goebel, "Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress", 1st European Conference of the Prognostics and Health Management Society, Dresden, Germany, 07/2012.
Kulkarni, C., G. Biswas, and X. Koutsoukos, "A prognosis case study for electrolytic capacitor degradation in DC-DC converters", Annual Conference of the Prognostics and Health Management Society 2009, San Diego, CA, Prognostics and Health Management Society, 10/2009. Abstract  Download: Kulkarni_Biswas_Koutsoukos_PHM09.pdf (632.25 KB)
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostic Modeling and Experimental Techniques for Electrolytic Capacitor Health Monitoring", 8th International Workshop on Structural Health Monitoring, IWSHM 2011, Stanford, CA, 09/2011.
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai, "Prognostics Approach for Power MOSFET under Thermal-Stress Aging", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
Kulkarni, C., C. Jose, G. Biswas, and K. Goebel, "Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors", AIAA Infotech@Aerospace Conference, Garden Grove, CA, American Institute of Aeronautics and Astronautics,, 06/2012.  Download: AIAA2012_Final_Kulkarni_Celaya_Biswas_Goebel1.pdf (385.28 KB)
Kulkarni, C., J. Celaya, K. Goebel, and G. Biswas, "Prognostics of Power Electronics, methods and validation experiments", IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012. Abstract
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostics Techniques For Capacitor Degradation and Health Monitoring", The Maintenance & Reliability Conference, MARCON 2011, Knoxville, TN, MARCON, 03/2011. Abstract  Download: MARCON_2011_Kulkarni_Biswas_Celaya_Goebel.pdf (367.09 KB)
Jose, C., C. Kulkarni, G. Biswas, and G. Kai, "Towards Prognostics of Electrolytic Capacitors", Infotech@Aerospace 2011, St. Louis, Missouri, AIAA, 04/2011.
Journal Article
Jose, C., C. Kulkarni, G. Biswas, and G. Kai, "Prognostic Studies and Physics of failure mod- eling under High Electrical Stress for Electrolytic Capacitors", International Journal of Prognostics and Health Management, vol. 4, no. 2013, 2013.
Kulkarni, C., J. Celaya, G. Biswas, and K. Goebel, "Prognostics of Power Electronics, methods and validation experiments", 2012 IEEE AUTOTESTCON Proceedings, 2012.