Kulkarni, C., C. Jose, G. Biswas, and G. Kai,
"Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics",
IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012.
Kulkarni, C., C. Jose, G. Biswas, and G. Kai,
"Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions",
Annual Conference of the Prognostics and Health Management Society, Minneapolis, MN, PHM Society, 09/2012.
Abstract
Jose, C., C. Kulkarni, G. Biswas, S. Sankalita, and G. Kai,
"A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging",
Annual Conference of the Prognostics and Health Management Society (PHM 2011), Montreal, Canada, Prognostics and Health Management Society, 10/2011.
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai,
"Prognostics Approach for Power MOSFET under Thermal-Stress Aging",
IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
Kulkarni, C., G. Biswas, C. Jose, and G. Kai,
"Prognostics Techniques For Capacitor Degradation and Health Monitoring",
The Maintenance & Reliability Conference, MARCON 2011, Knoxville, TN, MARCON, 03/2011.
Abstract
Download: MARCON_2011_Kulkarni_Biswas_Celaya_Goebel.pdf (367.09 KB)
Jose, C., C. Kulkarni, G. Biswas, and G. Kai,
"Towards Prognostics of Electrolytic Capacitors",
Infotech@Aerospace 2011, St. Louis, Missouri, AIAA, 04/2011.