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Conference Paper
Kulkarni, C., G. Biswas, X. Koutsoukos, G. Kai, and C. Jose, "Physics of Failure Models for Capacitor Degradation in DC-DC Converters", The Maintenance & Reliability Conference, MARCON 2010, Knoxville, TN, MARCON, 02/2010. Abstract  Download: KulkarniBiswasKoutsoukos_GoebelCelaya_MARCON2010.pdf (337.41 KB)
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors", IEEE 2011 Workshop on Accelerated Stress Testing & Reliability, San Francisco, CA, IEEE, 10/2011.
Conference Proceedings
Kulkarni, C., C. Jose, G. Biswas, and G. Kai, "Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics", IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012.
Kulkarni, C., C. Jose, G. Biswas, and G. Kai, "Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions", Annual Conference of the Prognostics and Health Management Society, Minneapolis, MN, PHM Society, 09/2012. Abstract
Kulkarni, C., G. Biswas, X. Koutsoukos, C. Jose, and K. Goebel, "Integrated Diagnostic/Prognostic Experimental Setup for Capacitor Degradation and Health Monitoring", IEEE AUTOTESTCON 2010, Orlando, FL, IEEE, 09/2010.
Jose, C., C. Kulkarni, G. Biswas, S. Sankalita, and G. Kai, "A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging", Annual Conference of the Prognostics and Health Management Society (PHM 2011), Montreal, Canada, Prognostics and Health Management Society, 10/2011.
Kulkarni, C., C. Jose, G. Biswas, and K. Goebel, "Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress", 1st European Conference of the Prognostics and Health Management Society, Dresden, Germany, 07/2012.
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostic Modeling and Experimental Techniques for Electrolytic Capacitor Health Monitoring", 8th International Workshop on Structural Health Monitoring, IWSHM 2011, Stanford, CA, 09/2011.
Kulkarni, C., C. Jose, G. Biswas, and K. Goebel, "Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors", AIAA Infotech@Aerospace Conference, Garden Grove, CA, American Institute of Aeronautics and Astronautics,, 06/2012.  Download: AIAA2012_Final_Kulkarni_Celaya_Biswas_Goebel1.pdf (385.28 KB)
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostics Techniques For Capacitor Degradation and Health Monitoring", The Maintenance & Reliability Conference, MARCON 2011, Knoxville, TN, MARCON, 03/2011. Abstract  Download: MARCON_2011_Kulkarni_Biswas_Celaya_Goebel.pdf (367.09 KB)
Jose, C., C. Kulkarni, G. Biswas, and G. Kai, "Towards Prognostics of Electrolytic Capacitors", Infotech@Aerospace 2011, St. Louis, Missouri, AIAA, 04/2011.
Journal Article
Jose, C., C. Kulkarni, G. Biswas, and G. Kai, "Prognostic Studies and Physics of failure mod- eling under High Electrical Stress for Electrolytic Capacitors", International Journal of Prognostics and Health Management, vol. 4, no. 2013, 2013.