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A
Celaya, J., C. Kulkarni, G. Biswas, and K. Goebel, "Accelerated Aging in Electrolytic Capacitors for Prognostics", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
D
Kulkarni, C., G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel, "Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters", ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Philadelphia, PA, ASME, 10/2010.
E
Kulkarni, C., G. Biswas, X. Koutsoukos, K. Goebel, and J. Celaya, "Experimental studies of ageing in electrolytic capacitors", Annual Conference of the Prognostics and Health Management Society 2010, Porltand, OR, Prognostics and Health Management Society, 10/2010. Abstract
P
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai, "Prognostics Approach for Power MOSFET under Thermal-Stress Aging", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
Kulkarni, C., J. Celaya, K. Goebel, and G. Biswas, "Prognostics of Power Electronics, methods and validation experiments", IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012. Abstract
Kulkarni, C., J. Celaya, G. Biswas, and K. Goebel, "Prognostics of Power Electronics, methods and validation experiments", 2012 IEEE AUTOTESTCON Proceedings, 2012.