Celaya, J., C. Kulkarni, G. Biswas, and K. Goebel,
"Accelerated Aging in Electrolytic Capacitors for Prognostics",
IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
Kulkarni, C., G. Biswas, X. Koutsoukos, K. Goebel, and J. Celaya,
"Experimental studies of ageing in electrolytic capacitors",
Annual Conference of the Prognostics and Health Management Society 2010, Porltand, OR, Prognostics and Health Management Society, 10/2010.
Abstract
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai,
"Prognostics Approach for Power MOSFET under Thermal-Stress Aging",
IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
Kulkarni, C., J. Celaya, K. Goebel, and G. Biswas,
"Prognostics of Power Electronics, methods and validation experiments",
IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012.
Abstract