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Celaya, J., C. Kulkarni, G. Biswas, and K. Goebel, "Accelerated Aging in Electrolytic Capacitors for Prognostics", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
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Kulkarni, C., J. Celaya, K. Goebel, and G. Biswas, "Prognostics of Power Electronics, methods and validation experiments", IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012. Abstract
Kulkarni, C., C. Jose, G. Biswas, and K. Goebel, "Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors", AIAA Infotech@Aerospace Conference, Garden Grove, CA, American Institute of Aeronautics and Astronautics,, 06/2012.  Download: AIAA2012_Final_Kulkarni_Celaya_Biswas_Goebel1.pdf (385.28 KB)
Kulkarni, C., G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel, "Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters", ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems, Philadelphia, PA, ASME, 10/2010.
Kulkarni, C., C. Jose, G. Biswas, and K. Goebel, "Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress", 1st European Conference of the Prognostics and Health Management Society, Dresden, Germany, 07/2012.
Kulkarni, C., G. Biswas, X. Koutsoukos, K. Goebel, and J. Celaya, "Experimental studies of ageing in electrolytic capacitors", Annual Conference of the Prognostics and Health Management Society 2010, Porltand, OR, Prognostics and Health Management Society, 10/2010. Abstract
Kulkarni, C., J. Celaya, G. Biswas, and K. Goebel, "Prognostics of Power Electronics, methods and validation experiments", 2012 IEEE AUTOTESTCON Proceedings, 2012.
Kulkarni, C., G. Biswas, X. Koutsoukos, C. Jose, and K. Goebel, "Integrated Diagnostic/Prognostic Experimental Setup for Capacitor Degradation and Health Monitoring", IEEE AUTOTESTCON 2010, Orlando, FL, IEEE, 09/2010.