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Celaya, J.
,
S. Abhinav
,
C. Kulkarni
,
S. Sankalita
, and
G. Kai
,
"
Prognostics Approach for Power MOSFET under Thermal-Stress Aging
",
IEEE - The Annual Reliability and Maintainability Symposium
, Reno, Nevada, IEEE, 01/2012.
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