Kulkarni, C., Biswas, G., Jose, C., & Kai, G. (2011). Prognostic Modeling and Experimental Techniques for Electrolytic Capacitor Health Monitoring. 8th International Workshop on Structural Health Monitoring, IWSHM 2011. Stanford, CA. (Original work published September 2011)

Kulkarni, C., Biswas, G., Jose, C., & Kai, G. (2011). Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors. In IEEE 2011 Workshop on Accelerated Stress Testing & Reliability. San Francisco, CA: IEEE. (Original work published October 2011)

Kulkarni, C., Celaya, J., Biswas, G., & Goebel, K. (2012). Prognostics of Power Electronics, methods and validation experiments. 2012 IEEE AUTOTESTCON Proceedings.

Celaya, J., Abhinav, S., Kulkarni, C., Sankalita, S., & Kai, G. (2012). Prognostics Approach for Power MOSFET under Thermal-Stress Aging. IEEE - The Annual Reliability and Maintainability Symposium. Reno, Nevada: IEEE. (Original work published January 2012)

Celaya, J., Kulkarni, C., Biswas, G., & Goebel, K. (2012). Accelerated Aging in Electrolytic Capacitors for Prognostics. IEEE - The Annual Reliability and Maintainability Symposium. Reno, Nevada: IEEE. (Original work published January 2012)

Kulkarni, C., Jose, C., Biswas, G., & Goebel, K. (2012). Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors. AIAA Infotech@Aerospace Conference. Garden Grove, CA: American Institute of Aeronautics and Astronautics,. (Original work published June 2012)

Kulkarni, C., Jose, C., Biswas, G., & Goebel, K. (2012). Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress. 1st European Conference of the Prognostics and Health Management Society. Dresden, Germany. (Original work published July 2012)

Kulkarni, C., Celaya, J., Goebel, K., & Biswas, G. (2012). Prognostics of Power Electronics, methods and validation experiments. IEEE AUTOTESTCON. Anaheim, CA: IEEE. (Original work published September 2012)

Kulkarni, C., Jose, C., Biswas, G., & Kai, G. (2012). Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions. Annual Conference of the Prognostics and Health Management Society. Minneapolis, MN: PHM Society. (Original work published September 2012)

Kulkarni, C., Jose, C., Biswas, G., & Kai, G. (2012). Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics. IEEE AUTOTESTCON. Anaheim, CA: IEEE. (Original work published September 2012)