| Prognostics Approach for Power MOSFET under Thermal-Stress Aging | |
|---|---|
| Author | |
| Year of Conference |
2012
|
| Conference Name |
IEEE - The Annual Reliability and Maintainability Symposium
|
| Date Published |
01/2012
|
| Publisher |
IEEE
|
| Conference Location |
Reno, Nevada
|
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