| Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors | |
|---|---|
| Author | |
| Year of Publication |
2011
|
| Conference Name |
IEEE 2011 Workshop on Accelerated Stress Testing & Reliability
|
| Date Published |
10/2011
|
| Publisher |
IEEE
|
| Conference Location |
San Francisco, CA
|
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